Semi-physical development of holograms recorded in silver halide emulsions
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| Título: | Semi-physical development of holograms recorded in silver halide emulsions |
|---|---|
| Autor/es: | Bányász, Istvan | Beléndez, Augusto | Pascual, Inmaculada | Fimia Gil, Antonio |
| Grupo/s de investigación o GITE: | Holografía y Procesado Óptico |
| Centro, Departamento o Servicio: | Universidad de Alicante. Departamento de Física, Ingeniería de Sistemas y Teoría de la Señal | Universidad de Alicante. Departamento de Óptica, Farmacología y Anatomía | Universidad Miguel Hernández. Departamento de Ciencia de Materiales, Óptica y Tecnología Electrónica | Research Institute for Solid State Physics and Optics. Department of Laser Physics |
| Palabras clave: | Holography | Holographic recording materials | Silver halide emulsions | Bleached holograms |
| Área/s de conocimiento: | Óptica | Física Aplicada |
| Fecha de creación: | 2000 |
| Fecha de publicación: | 3-oct-2000 |
| Editor: | SPIE, The International Society for Optical Engineering |
| Cita bibliográfica: | BÁNYÁSZ, Istvan, et al. "Semi-physical development of holograms recorded in silver halide emulsions". En: Holography 2000 : 10-14 July 2000, St. Pölten, Austria / Tung H. Jeong, Werner K. Sobotka, editors. Bellingham, Wash. : SPIE, 2000. (Proceedings of SPIE; Vol. 4149). ISBN 978-0-81943-801-0, pp. 63-72 |
| Resumen: | In the course of experiments on measurement of the effects of processing on nonlinear characteristics of silver halide holograms recorded in Agfa-gevaert 8E75HD emulsions we found that, under certain circumstances, the AAC developer acted as a semi-physical developer instead of the normal chemical developing action. The developed and fixed holograms were of low optical density (<0.5) and of high diffraction efficiency (up to 15%). Phase contrast microscopy revealed that very clean phase gratings were obtained. This effect of the AAC developer was due to the replacement of one of its components, sodium carbonate of purest grade with that of for analysis grade of the same company. |
| URI: | http://hdl.handle.net/10045/9377 |
| ISBN: | 978-0-81943-801-0 |
| ISSN: | 0277-786X |
| DOI: | 10.1117/12.402460 |
| Idioma: | eng |
| Tipo: | info:eu-repo/semantics/article |
| Derechos: | Copyright 2000 Society of Photo-Optical Instrumentation Engineers. This paper was published in Proceedings of SPIE, vol. 4149, and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. |
| Revisión científica: | si |
| Versión del editor: | http://dx.doi.org/10.1117/12.402460 |
| Aparece en las colecciones: | INV - GHPO - Artículos de Revistas INV - GHPO - Comunicaciones a Congresos, Conferencias, etc. |
Archivos en este ítem:
| Archivo | Descripción | Tamaño | Formato | |
|---|---|---|---|---|
 SPIE_v4149_p63_2000.pdf | 672,41 kB | Adobe PDF | Abrir Vista previa | |
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