Characterization of contour regularities based on the Levenshtein edit distance

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10045/20235
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dc.contributorReconocimiento de Formas e Inteligencia Artificialen
dc.contributor.authorAbreu Salas, José Ignacio-
dc.contributor.authorRico-Juan, Juan Ramón-
dc.contributor.otherUniversidad de Alicante. Departamento de Lenguajes y Sistemas Informáticosen
dc.date.accessioned2012-01-09T09:18:15Z-
dc.date.available2012-01-09T09:18:15Z-
dc.date.issued2011-03-30-
dc.identifier.citationABREU, J.; RICO-JUAN, J.R. “Characterization of contour regularities based on the Levenshtein edit distance”. Pattern Recognition Letters. Vol. 32, No. 10 (15 July 2011). ISSN 0167-8655, pp. 1421-1427en
dc.identifier.issn0167-8655 (Print)-
dc.identifier.issn1872-7344 (Online)-
dc.identifier.urihttp://hdl.handle.net/10045/20235-
dc.description.abstractThis paper describes a new method for quantifying the regularity of contours and comparing them (when encoded by Freeman chain codes) in terms of a similarity criterion which relies on information gathered from Levenshtein edit distance computation. The criterion used allows subsequences to be found from the minimal cost edit sequence that specifies an alignment of contour segments which are similar. Two external parameters adjust the similarity criterion. The information about each similar part is encoded by strings that represent an average contour region. An explanation of how to construct a prototype based on the identified regularities is also reviewed. The reliability of the prototypes is evaluated by replacing contour groups (samples) by new prototypes used as the training set in a classification task. This way, the size of the data set can be reduced without sensibly affecting its representational power for classification purposes. Experimental results show that this scheme achieves a reduction in the size of the training data set of about 80% while the classification error only increases by 0.45% in one of the three data sets studied.en
dc.description.sponsorshipThis work is partially supported by the Spanish CICYT under project DPI2006-15542-C04-01, the Spanish MICINN through project TIN2009-14205-CO4-01, the Spanish research program Consolider Ingenio 2010: MIPRCV (CSD2007-00018) and by the PASCAL Network of Excellence.en
dc.languageengen
dc.publisherElsevieren
dc.subjectContour regularitiesen
dc.subjectShape prototypesen
dc.subjectEdit distanceen
dc.subject.otherLenguajes y Sistemas Informáticosen
dc.titleCharacterization of contour regularities based on the Levenshtein edit distanceen
dc.typeinfo:eu-repo/semantics/articleen
dc.peerreviewedsien
dc.identifier.doi10.1016/j.patrec.2011.03.021-
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.patrec.2011.03.021en
dc.rights.accessRightsinfo:eu-repo/semantics/restrictedAccessen
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/FP7/216886en
Aparece en las colecciones:INV - GRFIA - Artículos de Revistas
Investigaciones financiadas por la UE

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