Multilateral spectral radiance factor scale comparison
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http://hdl.handle.net/10045/64787
| Título: | Multilateral spectral radiance factor scale comparison |
|---|---|
| Autor/es: | Strothkämper, Christian | Ferrero Turrión, Alejandro | Koo, Annette | Jaanson, Priit | Ged, Guillaume | Obein, Gael | Källberg, Stefan | Audenaert, Jan | Leloup, Frédéric B. | Martínez-Verdú, Francisco M. | Perales, Esther | Schirmacher, Alfred | Campos Acosta, Joaquín |
| Grupo/s de investigación o GITE: | Visión y Color |
| Centro, Departamento o Servicio: | Universidad de Alicante. Departamento de Óptica, Farmacología y Anatomía |
| Palabras clave: | Spectral radiance factor | Multilateral scale comparison |
| Área/s de conocimiento: | Óptica |
| Fecha de publicación: | 1-mar-2017 |
| Editor: | Optical Society of America |
| Cita bibliográfica: | C. Strothkämper, A. Ferrero, A. Koo, P. Jaanson, G. Ged, G. Obein, S. Källberg, J. Audenaert, F. B. Leloup, F. M. Martínez-Verdú, E. Perales, A. Schirmacher, and J. Campos, "Multilateral spectral radiance factor scale comparison," Appl. Opt. 56, 1996-2006 (2017). doi:10.1364/AO.56.001996 |
| Resumen: | The field of spectral radiance factor (SRF) measurements has seen growing interest in recent years. Scale conformity has so far only been established between the national metrology institutes (NMIs) of Germany and the USA. This study aims at a bigger, multilateral scale comparison. For this purpose, a total of six NMIs participated in a scale comparison of goniospectrophotometers based on neutral and colored diffusely reflecting ceramics samples. In addition, two universities, providing a home-built gonioreflectometer and two widely used commercially available color measurement instruments, respectively, were involved. The wavelength range of the scale comparison covers the visible wavelength range from 380 nm to 780 nm. Results indicate systematic issues and that the uncertainty evaluation of the NMIs requires further work; although for the greatest part of the covered spectral range the agreement is good. |
| Patrocinador/es: | This work has been realized within the European Metrology Research Program (EMRP) project JRPIND52. The EMRP is jointly funded by the EMRP participating countries within EURAMET and the European Union. We thank the European Commission and EURAMET e.V. for financial support. |
| URI: | http://hdl.handle.net/10045/64787 |
| ISSN: | 1559-128X (Print) | 2155-3165 (Online) |
| DOI: | 10.1364/AO.56.001996 |
| Idioma: | eng |
| Tipo: | info:eu-repo/semantics/article |
| Derechos: | © 2017 Optical Society of America |
| Revisión científica: | si |
| Versión del editor: | http://dx.doi.org/10.1364/AO.56.001996 |
| Aparece en las colecciones: | INV - GVC - Artículos de Revistas |
Archivos en este ítem:
| Archivo | Descripción | Tamaño | Formato | |
|---|---|---|---|---|
 2017_Strothkamper_etal_ApplOpt_final.pdf | Versión final (acceso restringido) | 2,15 MB | Adobe PDF | Abrir Solicitar una copia |
 2017_Strothkamper_etal_ApplOpt_accepted.pdf | Accepted Manuscript (acceso abierto) | 6,69 MB | Adobe PDF | Abrir Vista previa |
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