Voltage dependence of retardance, flicker, and director angle orientation in reflective liquid crystal devices by average Stokes polarimetry

Abstract

Parallel-aligned liquid crystal on silicon devices (PA-LCoS) can be found nowadays in most of the advanced areas in optics and photonics. Many works have been dedicated to their characterization for optimum utilization in applications. However, usual techniques are based on diffractive or interferometric measurements. Recently, we proposed the use of Stokes polarimetry for a versatile yet easy to implement characterization. We show that the LCoS can modelled as a nonabsorbent reciprocal device which, combined with time-average Stokes polarimetry, enables to demonstrate robust measurements across the whole applied voltage range for the retardance and its flicker. One of the main novelties is that we also obtain the director orientation, which we show that changes across the voltage range, especially at larger applied voltages. This might affect in very sensitive applications. It might also provide a deeper insight into the internal dynamics in the LC layer.