Simultaneous Determination of Refractive Index and Thickness of Submicron Optical Polymer Films from Transmission Spectra
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Título: | Simultaneous Determination of Refractive Index and Thickness of Submicron Optical Polymer Films from Transmission Spectra |
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Autor/es: | Bonal, Víctor | Quintana, José A. | Villalvilla, José M. | Muñoz-Mármol, Rafael | Mira-Martínez, Jose C. | Boj, Pedro G. | Cruz, María E. | Castro, Yolanda | Díaz-García, María A. |
Grupo/s de investigación o GITE: | Física de la Materia Condensada |
Centro, Departamento o Servicio: | Universidad de Alicante. Departamento de Física Aplicada | Universidad de Alicante. Departamento de Óptica, Farmacología y Anatomía | Universidad de Alicante. Instituto Universitario de Materiales |
Palabras clave: | Polymeric films | Optical characterization | Transmission spectra | Dye-sensitized polymers |
Área/s de conocimiento: | Física Aplicada | Óptica | Física de la Materia Condensada |
Fecha de publicación: | 31-jul-2021 |
Editor: | MDPI |
Cita bibliográfica: | Bonal V, Quintana JA, Villalvilla JM, Muñoz-Mármol R, Mira-Martínez JC, Boj PG, Cruz ME, Castro Y, Díaz-García MA. Simultaneous Determination of Refractive Index and Thickness of Submicron Optical Polymer Films from Transmission Spectra. Polymers. 2021; 13(15):2545. https://doi.org/10.3390/polym13152545 |
Resumen: | High-transparency polymers, called optical polymers (OPs), are used in many thin-film devices, for which the knowledge of film thickness (h) and refractive index (n) is generally required. Spectrophotometry is a cost-effective, simple and fast non-destructive method often used to determine these parameters simultaneously, but its application is limited to films where h > 500 nm. Here, a simple spectrophotometric method is reported to obtain simultaneously the n and h of a sub-micron OP film (down to values of a few tenths of a nm) from its transmission spectrum. The method is valid for any OP where the n dispersion curve follows a two-coefficient Cauchy function and complies with a certain equation involving n at two different wavelengths. Remarkably, such an equation is determined through the analysis of n data for a wide set of commercial OPs, and its general validity is demonstrated. Films of various OPs (pristine or doped with fluorescent compounds), typically used in applications such as thin-film organic lasers, are prepared, and n and h are simultaneously determined with the proposed procedure. The success of the method is confirmed with variable-angle spectroscopic ellipsometry. |
Patrocinador/es: | Spanish Ministry of Economy and Competitivity (MINECO) and European Community (FEDER) through grant no. MAT2015-66586-R. |
URI: | http://hdl.handle.net/10045/117192 |
ISSN: | 2073-4360 |
DOI: | 10.3390/polym13152545 |
Idioma: | eng |
Tipo: | info:eu-repo/semantics/article |
Derechos: | © 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
Revisión científica: | si |
Versión del editor: | https://doi.org/10.3390/polym13152545 |
Aparece en las colecciones: | INV - Física de la Materia Condensada - Artículos de Revistas |
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