Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems

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dc.contributorUniCAD: Grupo de investigación en CAD/CAM/CAE de la Universidad de Alicantees_ES
dc.contributor.authorSerrano-Cases, Alejandro-
dc.contributor.authorRestrepo Calle, Felipe-
dc.contributor.authorCuenca-Asensi, Sergio-
dc.contributor.authorMartínez-Álvarez, Antonio-
dc.contributor.otherUniversidad de Alicante. Departamento de Tecnología Informática y Computaciónes_ES
dc.date.accessioned2020-04-12T10:42:36Z-
dc.date.available2020-04-12T10:42:36Z-
dc.date.issued2020-02-
dc.identifier.citationJournal of Electronic Testing. 2020, 36: 47-57. https://doi.org/10.1007/s10836-019-05846-4es_ES
dc.identifier.issn0923-8174 (Print)-
dc.identifier.issn1573-0727 (Online)-
dc.identifier.urihttp://hdl.handle.net/10045/105452-
dc.description.abstractThis article presents a software protection technique against radiation-induced faults which is based on a multi-threaded strategy. Data triplication and instructions flow duplication or triplication techniques are used to improve system reliability and thus, ensure a correct system operation. To achieve this objective, a relaxed lockstep model to synchronize the execution of both, redundant threads and variables under protection on different processing units is defined. The evaluation was performed by means of simulated fault injection campaigns in a multi-core ARM system. Results show that despite being considered techniques that imply an evident overhead in memory and instructions (Duplication With Comparison and Re-Execution – DWC-R and Triple Modular Redundancy – TMR), spreading the replicas in different instruction flows not only produce similar results than classic techniques, but also improves the computational and recovery time in presence of soft-errors. In addition, this paper highlights the importance of protecting memory-allocated data, since the instruction flow triplication is not enough to improve the overall system reliability.es_ES
dc.description.sponsorshipThis work was funded by the Spanish Ministry of Economy and Competitiveness and the European Regional Development Fund through the following projects: ‘Evaluación temprana de los efectos de radiación mediante simulación y virtualización. Estrategias de mitigación en arquitecturas de microprocesadores avanzados’, (Ref: ESP2015-68245-C4-3-P, MINECO/FEDER, UE).es_ES
dc.languageenges_ES
dc.publisherSpringer Naturees_ES
dc.rights© Springer Science+Business Media, LLC, part of Springer Nature 2019es_ES
dc.subjectFault tolerancees_ES
dc.subjectReliabilityes_ES
dc.subjectThread replicationes_ES
dc.subjectLock-stepes_ES
dc.subjectSoft errorses_ES
dc.subjectBare-metales_ES
dc.subject.otherArquitectura y Tecnología de Computadoreses_ES
dc.titleMulti-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systemses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.peerreviewedsies_ES
dc.identifier.doi10.1007/s10836-019-05846-4-
dc.relation.publisherversionhttps://doi.org/10.1007/s10836-019-05846-4es_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
dc.relation.projectIDinfo:eu-repo/grantAgreement/MINECO//ESP2015-68245-C4-3-P-
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