Study on Multipactor Breakdown in Coaxial to Microstrip Transitions

Please use this identifier to cite or link to this item: http://hdl.handle.net/10045/83767
Full metadata record
Full metadata record
DC FieldValueLanguage
dc.contributorGrupo de Microondas y Electromagnetismo Computacional Aplicado (GMECA)es_ES
dc.contributor.authorSánchez-Soriano, Miguel Ángel-
dc.contributor.authorMarini, Stephan-
dc.contributor.authorVague, Joaquin-
dc.contributor.authorGómez, Celia-
dc.contributor.authorQuesada Pereira, Fernando-
dc.contributor.authorÁlvarez Melcón, Alejandro-
dc.contributor.authorBoria Esbert, Vicente Enrique-
dc.contributor.authorGulglielmi, Marco-
dc.contributor.otherUniversidad de Alicante. Departamento de Física, Ingeniería de Sistemas y Teoría de la Señales_ES
dc.date.accessioned2018-11-21T07:21:25Z-
dc.date.available2018-11-21T07:21:25Z-
dc.date.issued2018-10-30-
dc.identifier.citationSánchez-Soriano, Miguel A., et al. “Study on Multipactor Breakdown in Coaxial to Microstrip Transitions”. In: 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), ISBN 978-1-5090-4837-3, 4 p.es_ES
dc.identifier.isbn978-1-5090-4837-3-
dc.identifier.urihttp://hdl.handle.net/10045/83767-
dc.description.abstractThe objective of this paper is to study multipactor breakdown in coaxial to microstrip transitions. This kind of transitions generally exhibit a gap just below the central pin of the coaxial connector. This gap can create a region where the electric fields are relatively strong so that an electron path may be created that could potentially lead to a multipactor breakdown. In this paper, we study the multipactor modes which may be induced as a function of structural parameters, such as the substrate thickness and the gap length. In particular, it is found that two kinds of electron trajectory can be created leading to critical power levels that are even lower than those obtained with the parallel-plate model, generally used as a conservative model. In this context, we demonstrate that multipactor breakdown can happen for input power levels lower than 500 W. This, in turn, may become a critical issue for the use of classic coaxial to microstrip transitions in new high power satellites whenever payloads are manufactured using planar technology.es_ES
dc.description.sponsorshipThis work has been supported by the “Agencia Estatal de Investigación (AEI)” and by the EU through the ”Fondo Europeo de Desarrollo Regional -FEDER- Una manera de hacer Europa (AEI/FEDER, UE)”, under the coordinated research project TEC2016-75934-C4, and by the University of Alicante under the research project GRE16-17.es_ES
dc.languageenges_ES
dc.publisherIEEEes_ES
dc.rights© 2017 IEEEes_ES
dc.subjectCoaxial to microstrip transitiones_ES
dc.subjectHigh power applicationses_ES
dc.subjectMultipactores_ES
dc.subjectPower breakdown thresholdes_ES
dc.subject.otherElectromagnetismoes_ES
dc.subject.otherTeoría de la Señal y Comunicacioneses_ES
dc.titleStudy on Multipactor Breakdown in Coaxial to Microstrip Transitionses_ES
dc.typeinfo:eu-repo/semantics/conferenceObjectes_ES
dc.peerreviewedsies_ES
dc.identifier.doi10.1109/NEMO.2018.8503424-
dc.relation.publisherversionhttps://doi.org/10.1109/NEMO.2018.8503424es_ES
dc.rights.accessRightsinfo:eu-repo/semantics/restrictedAccesses_ES
Appears in Collections:INV - GMECA - Comunicaciones a Congresos, Conferencias, etc.

Files in This Item:
Files in This Item:
File Description SizeFormat 
Thumbnail2018_Sanchez-Soriano_etal_IEEE-NEMO_final.pdfVersión final (acceso restringido)270,66 kBAdobe PDFOpen    Request a copy


Items in RUA are protected by copyright, with all rights reserved, unless otherwise indicated.