An approach to the performance of SPC product codes on the erasure channel

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Title: An approach to the performance of SPC product codes on the erasure channel
Authors: Cardell, Sara D. | Climent, Joan-Josep
Research Group/s: Grupo de Álgebra y Geometría (GAG)
Center, Department or Service: Universidad de Alicante. Departamento de Matemáticas
Keywords: Erasure channel | SPC code | Erasure pattern | Bipartite graph | Connected component
Knowledge Area: Álgebra
Issue Date: Feb-2016
Publisher: American Institute of Mathematical Sciences (AIMS)
Citation: Advances in Mathematics of Communications. 2016, 10(1): 11-28. doi:10.3934/amc.2016.10.11
Abstract: Product codes can be used to correct errors or recover erasures. In this work we consider the simplest form of a product code, this is, the single parity check (SPC) product code. This code has a minimum distance of four and is thus guaranteed to recover all single, double, and triple erasure patterns. The code is actually capable of recovering a higher number of erasure patterns. We count the number of uncorrectable erasure patterns of size n×n with t erasures, for t=8, 2n−3, 2n−2 and 2n−1, using the relation between erasure patterns and bipartite graphs.
Sponsor: The work of the first author was supported by a grant for postdoctoral students from FAPESP with process 2015/07246-0 and a grant for postdoctoral students from Generalitat Valenciana with reference APOSTD/2013/081.
URI: http://hdl.handle.net/10045/62029
ISSN: 1930-5346 (Print) | 1930-5338 (Online)
DOI: 10.3934/amc.2016.10.11
Language: eng
Type: info:eu-repo/semantics/article
Rights: © 2016 AIMS
Peer Review: si
Publisher version: http://dx.doi.org/10.3934/amc.2016.10.11
Appears in Collections:INV - GAG - Artículos de Revistas

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