Anamorphic characterization of a PA-LCoS based holographic data storage system

Abstract

We have included a Parallel Aligned Liquid Crystal on Silicon (PA-LCoS) microdisplay in a Holographic Data Storage System (HDSS). This novel display, widely accepted as Spatial Light Modulator (SLM), presents some advantages and disadvantages. One of these disadvantages is the anamorphic and frequency dependent effect. In this work we want to test this effect and see its effects in the complete optical process involved in the HDSS. We will use stripe-based patterns with different orientation (vertical and horizontal). To check the limits, we will increase the data density by decreasing the minimum stripe width. For evaluating the degradation suffered by the data page, we use the Bit Error Rate (BER) as figure of merit. We make a BER calculation from the statistical analysis of the histogram. In addition to the anamorphic effects we evaluate the degradation effects introduced by the non-uniformity in the illumination. To this goal we divide the image in several regions that are processed in the same way that the entire image. The error analysis of the entire optical system is useful for its calibration and fine adjustment. Once we have characterized the experimental setup we introduce the holographic material. Thus, by making the same analysis, we can evaluate the errors introduced by the material. As holographic material we use Polyvinyl Alcohol Acrylamide (PVA/AA), that has been characterized and developed in previous works by our group.