Extended linear polarimeter to measure retardance and flicker: application to liquid crystal on silicon devices in two working geometries

Please use this identifier to cite or link to this item: http://hdl.handle.net/10045/35395
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Title: Extended linear polarimeter to measure retardance and flicker: application to liquid crystal on silicon devices in two working geometries
Authors: Martínez Guardiola, Francisco Javier | Márquez, Andrés | Gallego, Sergi | Francés, Jorge | Pascual, Inmaculada
Research Group/s: Holografía y Procesado Óptico
Center, Department or Service: Universidad de Alicante. Departamento de Física, Ingeniería de Sistemas y Teoría de la Señal | Universidad de Alicante. Departamento de Óptica, Farmacología y Anatomía | Universidad de Alicante. Instituto Universitario de Física Aplicada a las Ciencias y las Tecnologías
Keywords: Polarimeter | Retardance measurement | Liquid crystal on silicon displays | Parallel aligned | Phase-only modulation | Spatial light modulation | Flicker | Diffractive optics
Knowledge Area: Óptica | Física Aplicada
Date Created: 5-Nov-2013
Issue Date: 21-Jan-2014
Publisher: SPIE, The International Society for Optical Engineering
Citation: Martínez FJ, Márquez A, Gallego S, Francés J, Pascual I; Extended linear polarimeter to measure retardance and flicker: application to liquid crystal on silicon devices in two working geometries. Opt. Eng. 0001;53(1):014105. doi:10.1117/1.OE.53.1.014105
Abstract: We focus on the evaluation of the applicability of the classical and well-established linear polarimeter to the measurement of linear retardance in the presence of phase flicker. This analysis shows that there are large errors in the results provided by the linear polarimeter when measuring the linear retardance of a device. These errors depend on the specific retardance value under measurement. We show that there are some points where this limitation can be used to measure the fluctuation amplitude consistently. An elegant method is further proposed, enabling the measurement of the average retardance value, thus extending the applicability of the classical linear polarimeter. Experimental characterization results are provided for various electrical sequences addressed onto a parallel aligned liquid crystal on silicon (LCoS) display. Good agreement is obtained with experiment, thus validating the linear polarimeter methodology proposed. Furthermore, results are provided for the LCoS in two reflection geometries, perpendicular incidence with and without nonpolarizing beam splitter, demonstrating robustness of the method. As a result, the evaluation of both phase modulation range and flicker magnitude for any electrical sequence addressed can be easily obtained, which is very important for optimal use of LCoS displays in applications.
Sponsor: This work was supported by the Ministerio de Trabajo y Competitividad of Spain (projects FIS2011-29803-C02-01 and FIS2011-29803-C02-02), by the Generalitat Valenciana of Spain (projects PROMETEO/2011/021 and ISIC/2012/013), and by Universidad de Alicante (project GRE12-14).
URI: http://hdl.handle.net/10045/35395
ISSN: 0091-3286 (Print) | 1560-2303 (Online)
DOI: 10.1117/1.OE.53.1.014105
Language: eng
Type: info:eu-repo/semantics/article
Rights: Copyright 2014 Society of Photo-Optical Instrumentation Engineers. This paper was published in Opt. Eng., 53(1) (Jan. 2014) and is made available as an electronic reprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Peer Review: si
Publisher version: http://dx.doi.org/10.1117/1.OE.53.1.014105
Appears in Collections:INV - GHPO - Artículos de Revistas

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