Beléndez, Augusto, Beléndez, Tarsicio, Neipp, Cristian, Pascual, Inmaculada
Determination of the refractive index and thickness of holographic silver halide materials by use of polarized reflectances
BELÉNDEZ VÁZQUEZ, Augusto, et al. “Determination of the refractive index and thickness of holographic silver halide materials by use of polarized reflectances”. Applied Optics. Vol. 41, Issue 32 (Nov. 2002). ISSN 0003-6935, pp. 6802-6808
URI: http://hdl.handle.net/10045/7122
DOI: 
ISSN: 0003-6935
Abstract: 
A method to determine the refractive index and thickness of silver halide emulsions used in holography is presented. The emulsions are in the form of a layer of film deposited on a thick glass plate. The experimental reflectances of p-polarized light are measured as a function of the incident angles, and the values of refractive index, thickness, and extinction coefficient of the emulsion are obtained by using the theoretical equation for reflectance. As examples, five commercial holographic silver halide emulsions are analyzed. The procedure to obtain the measurements and the numerical analysis of the experimental
data are simple, and agreement of the calculated reflectances, by use of the thickness and refractive index obtained, with the measured reflectances is satisfactory.
Keywords:Holography, Holographic recording materials, Silver halide emulsions, Optical constants, Optical measurements
Optical Society of America
info:eu-repo/semantics/article