Experimental results in thickness and index variations to the analysis of holographic aberrations

Abstract

Variations in the average refractive index and thickness of the holographic recording material are present due to chemical processing. These changes produce a reordering of the internal structure of the interference fringes so we can see that the processed material and the registered material are different. In this paper we have analyzed the influences of exposure and geometric disposition of the recording beams on the variations of the maximum diffraction efficiency. Our previous resarch1 has shown that the parameter used to analyze the influences of the thickness and index variations is defined as: (formula available on paper) where T = tC/tR and N = nC/nR (t and n represent the thickness and the refractive index of the medium, respectively); aR, and a the angles in relation to the normal for holograms.