Analysis of PVA/AA based photopolymers at the zero spatial frequency limit using interferometric methods

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Title: Analysis of PVA/AA based photopolymers at the zero spatial frequency limit using interferometric methods
Authors: Gallego, Sergi | Márquez, Andrés | Méndez Alcaraz, David Israel | Ortuño, Manuel | Neipp, Cristian | Fernandez-Varo, Helena | Pascual, Inmaculada | Beléndez, Augusto
Research Group/s: Holografía y Procesado Óptico
Center, Department or Service: Universidad de Alicante. Departamento de Física, Ingeniería de Sistemas y Teoría de la Señal | Universidad de Alicante. Departamento de Óptica, Farmacología y Anatomía
Keywords: Holography | Holographic recording materials | Photopolymers
Knowledge Area: Óptica | Física Aplicada
Date Created: 6-Feb-2008
Issue Date: 10-May-2008
Publisher: Optical Society of America
Citation: GALLEGO RICO, Sergi, et al. "Analysis of PVA/AA based photopolymers at the zero spatial frequency limit using interferometric methods". Applied Optics. Vol. 47, No. 14 (May 2008). ISSN 0003-6935, pp. 2557-2563
Abstract: One of the problems associated with photopolymers as optical recording media is the thickness variation during the recording process. Different values of shrinkages or swelling are reported in the literature for photopolymers. Furthermore, these variations depend on the spatial frequencies of the gratings stored in the materials. Thickness variations can be measured using different methods: studying the deviation from the Bragg's angle for nonslanted gratings, using MicroXAM S/N 8038 interferometer, or by the thermomechanical analysis experiments. In a previous paper, we began the characterization of the properties of a polyvinyl alcohol/acrylamide based photopolymer at the lowest end of recorded spatial frequencies. In this work, we continue analyzing the thickness variations of these materials using a reflection interferometer. With this technique we are able to obtain the variations of the layers refractive index and, therefore, a direct estimation of the polymer refractive index.
Sponsor: This work was supported by the “Ministerio de Educación y Ciencia” (Spain) under projects FIS2005-05881-C02-01 and FIS2005-05881-C02-02, and by Generalitat Valenciana under project GV06-007.
ISSN: 0003-6935 (Print) | 1539-4522 (Online)
DOI: 10.1364/AO.47.002557
Language: eng
Type: info:eu-repo/semantics/article
Rights: This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Peer Review: si
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