Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool?
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http://hdl.handle.net/10045/72665
Títol: | Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool? |
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Autors: | Dapor, Maurizio | Masters, Robert C. | Ross, Ian | Lidzey, David G. | Pearson, Andrew | Abril, Isabel | García Molina, Rafael | Sharp, Jo | Unčovský, Marek | Vystavel, Tomas | Mika, Filip | Rodenburg, Cornelia |
Grups d'investigació o GITE: | Interacción de Partículas Cargadas con la Materia |
Centre, Departament o Servei: | Universidad de Alicante. Departamento de Física Aplicada |
Paraules clau: | Secondary electron spectra | Semi-crystalline polymers | Polymer characterisation tool |
Àrees de coneixement: | Física Aplicada |
Data de publicació: | de gener-2018 |
Editor: | Elsevier |
Citació bibliogràfica: | Journal of Electron Spectroscopy and Related Phenomena. 2018, 222: 95-105. doi:10.1016/j.elspec.2017.08.001 |
Resum: | The nano-scale dispersion of ordered/disordered phases in semi-crystalline polymers can strongly influence their performance e.g. in terms of mechanical properties and/or electronic properties. However, to reveal the latter in scanning electron microscopy (SEM) often requires invasive sample preparation (etching of amorphous phase), because SEM usually exploits topographical contrast or yield differences between different materials. However, for pure carbon materials the secondary spectra were shown to differ substantially with increased order/disorder. The aims here is to gain an understanding of the shape of secondary electron spectrum (SES) of a widely used semi-crystalline polymer regioregular poly(3-hexylthiophene-2,5-diyl), commonly known as P3HT, and its links to the underlying secondary electron emission mechanisms so SES can be exploited for the mapping the nano-morphology. The comparison of simulated and experimental SES shows an excellent agreement, revealing a peak (at about 0.8 eV) followed by a broad shoulder (between 2 eV and 4.5 eV) with respective relative intensities reflecting order/disorder. |
Patrocinadors: | MD acknowledges the support of the The LeverhulmeTrust through the Visiting Professorship (VP1-2014-011) that made this project possible. IA and RGM thank partial financial support by the Spanish Ministerio de Economía y Competitividad (Project FIS2014-58849-P) and the Fundación Séneca – Murcia Regional Agency of Science and Technology (project 19907/GERM/15). CR thanks EPSRC for funding under grant EP/N008065/1. |
URI: | http://hdl.handle.net/10045/72665 |
ISSN: | 0368-2048 (Print) | 1873-2526 (Online) |
DOI: | 10.1016/j.elspec.2017.08.001 |
Idioma: | eng |
Tipus: | info:eu-repo/semantics/article |
Drets: | © 2017 Elsevier B.V. |
Revisió científica: | si |
Versió de l'editor: | http://dx.doi.org/10.1016/j.elspec.2017.08.001 |
Apareix a la col·lecció: | INV - IPCM - Artículos de Revistas |
Arxius per aquest ítem:
Arxiu | Descripció | Tamany | Format | |
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2018_Dapor_etal_JElectronSpectrRelPhenom_final.pdf | Versión final (acceso restringido) | 1,85 MB | Adobe PDF | Obrir Sol·licitar una còpia |
2018_Dapor_etal_JElectronSpectrRelPhenom_accepted.pdf | Accepted Manuscript (acceso abierto) | 1,65 MB | Adobe PDF | Obrir Vista prèvia |
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