Copper underpotential deposition at gold surfaces in contact with a deep eutectic solvent: New insights

Por favor, use este identificador para citar o enlazar este ítem: http://hdl.handle.net/10045/65514
Registro completo de metadatos
Registro completo de metadatos
Campo DCValorIdioma
dc.contributorElectroquímica de Superficieses_ES
dc.contributor.authorSebastián, Paula-
dc.contributor.authorGómez, Elvira-
dc.contributor.authorCliment, Victor-
dc.contributor.authorFeliu, Juan M.-
dc.contributor.otherUniversidad de Alicante. Departamento de Química Físicaes_ES
dc.contributor.otherUniversidad de Alicante. Instituto Universitario de Electroquímicaes_ES
dc.date.accessioned2017-04-26T10:43:29Z-
dc.date.available2017-04-26T10:43:29Z-
dc.date.issued2017-05-
dc.identifier.citationElectrochemistry Communications. 2017, 78: 51-55. doi:10.1016/j.elecom.2017.03.020es_ES
dc.identifier.issn1388-2481 (Print)-
dc.identifier.issn1873-1902 (Online)-
dc.identifier.urihttp://hdl.handle.net/10045/65514-
dc.description.abstractThe electrodeposition of copper on a polycrystalline gold electrode and on Au(hkl) single crystals was investigated in a deep eutectic solvent (DES). The DES employed consisted of a mixture of choline chloride and urea (1:2). The Au(hkl)/DES interface was studied using cyclic voltammetry in the capacitive region. The blank voltammograms showed characteristic features, not previously reported, that demonstrate the surface sensitivity of this solvent. Copper electrodeposition was then studied and it was found that this takes place through the formation of an underpotential deposition (UPD) adlayer, demonstrating the surface sensitivity of this process. Voltammetric profiles showed similarities with those obtained in aqueous solutions containing chloride, suggesting that the copper UPD in this DES is strongly influenced by the presence of chloride.es_ES
dc.description.sponsorshipFinancial support from MINECO through projects CTQ2016-76221-P (AEI/FEDER, UE) and TEC2014-51940-C2-2-R (AEI/FEDER, UE) are greatly acknowledged. P. Sebastian also acknowledges MECD for FPU grant.es_ES
dc.languageenges_ES
dc.publisherElsevieres_ES
dc.rights© 2017 Elsevier B.V.es_ES
dc.subjectSingle crystales_ES
dc.subjectDeep eutectic solventes_ES
dc.subjectInterfacees_ES
dc.subjectUnderpotential depositiones_ES
dc.subjectChloridees_ES
dc.subject.otherQuímica Físicaes_ES
dc.titleCopper underpotential deposition at gold surfaces in contact with a deep eutectic solvent: New insightses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.peerreviewedsies_ES
dc.identifier.doi10.1016/j.elecom.2017.03.020-
dc.relation.publisherversionhttp://dx.doi.org/10.1016/j.elecom.2017.03.020es_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
dc.relation.projectIDinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/CTQ2016-76221-P-
dc.relation.projectIDinfo:eu-repo/grantAgreement/MINECO//TEC2014-51940-C2-2-R-
Aparece en las colecciones:INV - EQSUP - Artículos de Revistas

Archivos en este ítem:
Archivos en este ítem:
Archivo Descripción TamañoFormato 
Thumbnail2017_Sebastian_etal_ElectrComm_final.pdfVersión final (acceso restringido)355,15 kBAdobe PDFAbrir    Solicitar una copia
Thumbnail2017_Sebastian_etal_ElectrComm_accepted.pdfAccepted Manuscript (acceso abierto)840,47 kBAdobe PDFAbrir Vista previa


Todos los documentos en RUA están protegidos por derechos de autor. Algunos derechos reservados.