Characterization of the interfaces between Au(hkl) single crystal basal plane electrodes and [Emmim][Tf2N] ionic liquid

Please use this identifier to cite or link to this item: http://hdl.handle.net/10045/51989
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Title: Characterization of the interfaces between Au(hkl) single crystal basal plane electrodes and [Emmim][Tf2N] ionic liquid
Authors: Sebastián, Paula | Climent, Victor | Feliu, Juan M.
Research Group/s: Electroquímica de Superficies
Center, Department or Service: Universidad de Alicante. Departamento de Química Física | Universidad de Alicante. Instituto Universitario de Electroquímica
Keywords: Emmim][Tf2N ionic liquid | Gold single crystal | Potential of zero charge | Phase transition | Laser induced temperature jump | Cyclic voltammetry
Knowledge Area: Química Física
Issue Date: Jan-2016
Publisher: Elsevier
Citation: Electrochemistry Communications. 2016, 62: 44-47. doi:10.1016/j.elecom.2015.11.005
Abstract: The interface between Au(hkl) basal planes and the ionic liquid 1-Ethyl-2,3-dimethyl imidazolium bis(trifluoromethyl)sulfonil imide was investigated by using both cyclic voltammetry and laser-induced temperature jump. Cyclic voltammetry showed characteristic features, revealing surface sensitive processes at the interfaces Au(hkl)/[Emmim][Tf2N]. From laser-induced heating the potential of maximum entropy (pme) is determined. Pme is close to the potential of zero charge (pzc) and, therefore, the technique provides relevant interfacial information. The following order for the pme values has been found: Au(111) > Au(100) > Au(110). This order correlates well with work function data and values of pzc in aqueous solutions.
Sponsor: Financial support from MINECTO through project CTQ2013-44083-P is greatly acknowledged. P. Sebastian also acknowledges MECD for the award of a FPU grant.
URI: http://hdl.handle.net/10045/51989
ISSN: 1388-2481 (Print) | 1873-1902 (Online)
DOI: 10.1016/j.elecom.2015.11.005
Language: eng
Type: info:eu-repo/semantics/article
Rights: © 2015 Elsevier B.V.
Peer Review: si
Publisher version: http://dx.doi.org/10.1016/j.elecom.2015.11.005
Appears in Collections:INV - EQSUP - Artículos de Revistas

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