Characterization of the interfaces between Au(hkl) single crystal basal plane electrodes and [Emmim][Tf2N] ionic liquid
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Title: | Characterization of the interfaces between Au(hkl) single crystal basal plane electrodes and [Emmim][Tf2N] ionic liquid |
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Authors: | Sebastián, Paula | Climent, Victor | Feliu, Juan M. |
Research Group/s: | Electroquímica de Superficies |
Center, Department or Service: | Universidad de Alicante. Departamento de Química Física | Universidad de Alicante. Instituto Universitario de Electroquímica |
Keywords: | Emmim][Tf2N ionic liquid | Gold single crystal | Potential of zero charge | Phase transition | Laser induced temperature jump | Cyclic voltammetry |
Knowledge Area: | Química Física |
Issue Date: | Jan-2016 |
Publisher: | Elsevier |
Citation: | Electrochemistry Communications. 2016, 62: 44-47. doi:10.1016/j.elecom.2015.11.005 |
Abstract: | The interface between Au(hkl) basal planes and the ionic liquid 1-Ethyl-2,3-dimethyl imidazolium bis(trifluoromethyl)sulfonil imide was investigated by using both cyclic voltammetry and laser-induced temperature jump. Cyclic voltammetry showed characteristic features, revealing surface sensitive processes at the interfaces Au(hkl)/[Emmim][Tf2N]. From laser-induced heating the potential of maximum entropy (pme) is determined. Pme is close to the potential of zero charge (pzc) and, therefore, the technique provides relevant interfacial information. The following order for the pme values has been found: Au(111) > Au(100) > Au(110). This order correlates well with work function data and values of pzc in aqueous solutions. |
Sponsor: | Financial support from MINECTO through project CTQ2013-44083-P is greatly acknowledged. P. Sebastian also acknowledges MECD for the award of a FPU grant. |
URI: | http://hdl.handle.net/10045/51989 |
ISSN: | 1388-2481 (Print) | 1873-1902 (Online) |
DOI: | 10.1016/j.elecom.2015.11.005 |
Language: | eng |
Type: | info:eu-repo/semantics/article |
Rights: | © 2015 Elsevier B.V. |
Peer Review: | si |
Publisher version: | http://dx.doi.org/10.1016/j.elecom.2015.11.005 |
Appears in Collections: | INV - EQSUP - Artículos de Revistas |
Files in This Item:
File | Description | Size | Format | |
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2016_Sebastian_etal_ElectrComm_final.pdf | Versión final (acceso restringido) | 712,57 kB | Adobe PDF | Open Request a copy |
2016_Sebastian_etal_ElectrComm_accepted.pdf | Accepted Manuscript (acceso abierto) | 628,14 kB | Adobe PDF | Open Preview |
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