A comparative study of texture analysis algorithms in textile inspection applications
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|Title:||A comparative study of texture analysis algorithms in textile inspection applications|
|Authors:||Ibarra Picó, Francisco | Cuenca-Asensi, Sergio | García Crespi, Federico | Lorenzo Quintanilla, Juan José | Morales Benavente, José Luis|
|Research Group/s:||UniCAD: Grupo de Investigación en CAD/CAM/CAE de la Universidad de Alicante|
|Center, Department or Service:||Universidad de Alicante. Departamento de Tecnología Informática y Computación|
|Keywords:||Texture analysis | Textile inspection|
|Knowledge Area:||Arquitectura y Tecnología de Computadores|
|Citation:||IBARRA PICÓ, Francisco, et al. "A comparative study of texture analysis algorithms in textile inspection applications". En: Proceedings of the 12th Scandinavian Conference on Image Analysis : Bergen 11th - 14th June, 2001 / editor: Ivar Austevoll. Stavanger : NOBIM, 2001. ISBN 82-995940-0-6|
|Abstract:||Nowadays, quality control is an important problem for fabric manufacturers. Typically these operations have been carried out by humans operators. However, this method has numerous drawbacks such as low precision, performance and effectiveness. Therefore, automatic inspection systems have increased substantially in the last decade. This work evaluates the performance of some texture measures in textile defect detection applications. For classification a method based on leaving-one-out is used. Our study has been carried out using a large database of samples to take into account a wide spectrum of fabrics and multiple defects of different nature reported by specialized works and publications. A ranking with the effectiveness of best algorithms is presented for every type of fabric. In addition, the computation time of algorithms is compared.|
|Sponsor:||This work is partially backed by the European Community (FEDER project).|
|Appears in Collections:||INV - UNICAD - Comunicaciones a Congresos, Conferencias, etc.|
INV - TIA-SL - Comunicaciones a Congresos, Conferencias, etc.
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